The C540 features advanced BSI CDS sensor technology with ultra-low read noise below 5 e⁻, delivering outstanding image clarity for reliable measurements even in challenging imaging environments. Its 4 MP, 1-inch sensor with a 5-micron pixel preserves critical detail with the accuracy demanding scientific and engineering work requires.
A fully self-contained system designed for flexible deployment. Built-in programmable I/O, onboard target storage, and standard RJ45 Ethernet eliminate the need for external controllers or complex infrastructure enabling fast setup, simplified workflows, and efficient data capture across a wide range of environments.
- No Junction Box Required: A compact, standalone design removes tethered infrastructure, making the camera easy to deploy in constrained or distributed test setups.
- Integrated Control & Sync: Programmable I/O, on-camera controls, 3G-SDI video output, and IRIG-B timecode enable precise timing, synchronization, and monitoring.
- Streamlined Storage & Transfer: Onboard target storage with up to 63 multi-cine partitions, plus an integrated USB-A port for direct transfer of .cine files to flash drives.
Built on Phantom’s proven engineering approach, the C-Series delivers dependable performance in demanding laboratory and industrial conditions. Its ultra-compact 9.6 × 9.6 × 6.8 cm form factor and lightweight 1.4 lb (0.6 kg) body fit laboratory benches, test stands, microscopes, and space-constrained environments — with active cooling and a quiet mode that disables fans during capture.
- Flexible Lens Integration: C-mount and RF-mount housing variants, plus support for M42×1.0, M42×0.75, and EF/F-mount adapters, matches optics to a wide range of use cases.
- Rugged & Deployable: Preliminary 30G operational shock rating and standard 1/4-20 and M4 mounting points on all faces support reliable deployment in the field and lab.
- Repeatable Results: Programmable I/O with external sync via F-SYNC or IRIG-B timecode ensures synchronization with other equipment, improving repeatability across tests.